JPH0136061B2 - - Google Patents
Info
- Publication number
- JPH0136061B2 JPH0136061B2 JP55164464A JP16446480A JPH0136061B2 JP H0136061 B2 JPH0136061 B2 JP H0136061B2 JP 55164464 A JP55164464 A JP 55164464A JP 16446480 A JP16446480 A JP 16446480A JP H0136061 B2 JPH0136061 B2 JP H0136061B2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- slit
- ray
- straight line
- rays
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000013078 crystal Substances 0.000 claims description 12
- 238000005192 partition Methods 0.000 claims description 10
- 230000005284 excitation Effects 0.000 claims description 9
- 230000005855 radiation Effects 0.000 claims description 4
- 238000004458 analytical method Methods 0.000 description 6
- 238000001228 spectrum Methods 0.000 description 3
- 229910000831 Steel Inorganic materials 0.000 description 2
- 238000010894 electron beam technology Methods 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000010959 steel Substances 0.000 description 2
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 1
- 238000004141 dimensional analysis Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 239000011593 sulfur Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
- G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Dispersion Chemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55164464A JPS5788354A (en) | 1980-11-21 | 1980-11-21 | X-ray analysing apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55164464A JPS5788354A (en) | 1980-11-21 | 1980-11-21 | X-ray analysing apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5788354A JPS5788354A (en) | 1982-06-02 |
| JPH0136061B2 true JPH0136061B2 (en]) | 1989-07-28 |
Family
ID=15793666
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55164464A Granted JPS5788354A (en) | 1980-11-21 | 1980-11-21 | X-ray analysing apparatus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5788354A (en]) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63139298A (ja) * | 1986-12-01 | 1988-06-11 | 科学技術庁無機材質研究所長 | モノクロメ−タ付簡易型一次元走査ｘ線回折顕微鏡 |
| JPS63139238A (ja) * | 1986-12-01 | 1988-06-11 | Natl Inst For Res In Inorg Mater | 簡易型一次元走査ｘ線回折顕微鏡 |
| JPH0727080B2 (ja) * | 1986-12-02 | 1995-03-29 | 科学技術庁無機材質研究所長 | 一次元走査ｘ線回折顕微鏡 |
| JPH077120B2 (ja) * | 1986-12-02 | 1995-01-30 | 科学技術庁無機材質研究所長 | 一次元位置検出器付走査ｘ線回折顕微鏡 |
| EP0553911A1 (en) * | 1992-01-27 | 1993-08-04 | Koninklijke Philips Electronics N.V. | Position-sensitive X-ray analysis |
| EP3627146A4 (en) * | 2017-05-18 | 2020-05-13 | Shimadzu Corporation | X-RAY SPECTROMETER |
| JP2019211252A (ja) * | 2018-05-31 | 2019-12-12 | キヤノン株式会社 | 識別装置 |
-
1980
- 1980-11-21 JP JP55164464A patent/JPS5788354A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5788354A (en) | 1982-06-02 |
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